🇺🇸 United States

9031808070

Other

Details

Parent HS6: 903180 Instruments, appliances and machines; for measuring or checking n.e.c. in chapter 90

Related United States Codes

903180 Other instruments, appliances and machines:

9031804000 Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles

9031808060 For testing electrical characteristics

9031808070 Other

9031808085 Other