🇨🇦 Canada

903141

Optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90, for inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

Canada Tariff Code 903141 falls under HS subheading 903141 (optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90). Preferential rates, trade remedies and other duties can change what you actually pay.

Details

Official Description: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
Parent HS6: 903141 Optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90

Related Canada Codes

903141 Optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90, for inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

903149 Optical instruments and appliances; for measuring or checking, n.e.c. in chapter 90, other

903190 Instruments, appliances and machines; parts and accessories for those measuring or checking devices of heading no. 9031, parts and accessories

HS 903141 in Other Countries

United States

3 tariff lines

European Union

9031410000

Norway

90314100

CBP Rulings for HS 903141

817479 The tariff classification of inspection systems from Belgium B89229 The tariff classification of the WT-85 Lifetime Scanner from Hungary B89495 The tariff classification of a Deep Level Transient Spectrometer and a Lifetime Scanner from Hungary D88817 The tariff classification of a Laser Electro Optics Edge (LEO) Profile Monitor Model LEP-820, Laser Electro Optics Edge Profile Monitor Model LEP-810, Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1000EP and Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1200EP from Japan D89035 The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan

View all 13 rulings for HS 903141 →