CBP Ruling Database
Search past U.S. Customs and Border Protection classification rulings. Find precedent for your product and cite it in your own classification.
13 rulings found
The tariff classification of inspection systems from Belgium
The tariff classification of inspection systems from Belgium
The tariff classification of the WT-85 Lifetime Scanner from Hungary
The tariff classification of the WT-85 Lifetime Scanner from Hungary
The tariff classification of a Deep Level Transient Spectrometer and a Lifetime Scanner from Hungary
The tariff classification of a Deep Level Transient Spectrometer and a Lifetime Scanner from Hungary
The tariff classification of a Laser Electro Optics Edge (LEO) Profile Monitor Model LEP-820, Laser Electro Optics Edge Profile Monitor Model LEP-810, Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1000EP and Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1200EP from Japan
The tariff classification of a Laser Electro Optics Edge (LEO) Profile Monitor Model LEP-820, Laser Electro Optics Edge Profile Monitor Model LEP-810, Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1000EP and Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1200EP from Japan
The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
The tariff classification of Wafer Auto Loaders from Japan
The tariff classification of Wafer Auto Loaders from Japan
Protest 2809-98-100442; Automatic Pellicle Mounting System; Measuring or Checking Instruments, Other Optical Instruments and Appliances.
Protest 2809-98-100442; Automatic Pellicle Mounting System; Measuring or Checking Instruments, Other Optical Instruments and Appliances.
The tariff classification of Test Handlers from Switzerland
The tariff classification of Test Handlers from Switzerland
The tariff classification of the LED Chip Sorter from Japan
The tariff classification of the LED Chip Sorter from Japan
The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom
The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom
The tariff classification of wafer loaders from Japan
The tariff classification of wafer loaders from Japan
The tariff classification of the Cohu Ismeca NY32 from Malaysia
The tariff classification of the Cohu Ismeca NY32 from Malaysia
The tariff classification of a metrology and inspection machine from Israel
The tariff classification of a metrology and inspection machine from Israel