CBP Ruling Database

The tariff classification of a "Noise Hunter" from Japan.

The tariff classification of watch test instruments fromSwitzerland.

The tariff classification of quartz watch test instrumentsfrom Switzerland.

The tariff classification of a cable ID system from Canada

The tariff classification of an inductance tester fromSweden.

The tariff classification of magnetizing and demagnetizingequipment, magnetizing tools, and magnet measuring systems fromGermany.

The tariff classification of microwave leakage monitor fromTaiwan.

The tariff classification of an electromagnetic scanner andsoftware from Canada.

The tariff classification of measuring instruments fromCzechoslovakia.

The tariff classification of measuring instruments fromCzechoslovakia.

Revocation of PC 885626; Function Generators; Populated Circuit Boards; Explanatory Note 85.43; HQ 953551; HQ 089391; HQ 087498; U.S. v. Corning Glass Works; HQ 953382; Chapter 90, Note 2; 8543.20.00; 8543.90.80

The tariff classification of electrical measuring instrumentsfrom Switzerland.

The tariff classification of a phase sequence and motorrotation indicator from Canada.

The tariff classification of panel meters from Taiwan.

CMC 56 Test System for protection relays and measuring transducers; EN 85.24; EN 85.43; Chapter 85, note 6; Section XVI, note 4; Chapter 90, note 3; HQ 953551; HQ 089391; HQ 087498; U.S. v. Corning Glass Works

The tariff classification of Integrated Circuit Handlers from JapanDear A. J. Spatarella: In your letter dated March 23, 1995, you requested a tariff classification ruling. The Integrated Circuit Handlers (IC) are high speed robotics models HM-3000 and MTH-1800. The model HM-3000 high speed test handler is developed for high pin count surface mount devices. The HM-3000 is designed to handle devices from 7 mm to 70 mm with device pitches as small as 0.3 mm. The model MTH-1800 high speed test handler is developed for high pin count surface mount devices presented in trays. The MTH-1800 pick and place handlers can be operated in two modes, Mode I is single test site operation and Mode II is dual test site operation. The applicable subheading for the IC Handlers will be 9030.89.4000, Harmonized Tariff Schedule of the United States (HTS), which provides for other instruments and apparatus designed to measure and check semiconductor wafers and devices (such as probe testers, resistivi

Protest 1001-95-109483; KLA 1011 ACE Wafer Prober; KLA 1007 HF Wafer Prober

The tariff classification of a Bit Pattern Generator and an Error Analyzer from Germany.

PD B88154 Modified; Bit Pattern Generator, Signal-Producing Device Used in Testing Communications Equipment; Measuring or Checking Instrument; Instrument That Carries Out Steps in a Process of Inspecting Goods, Checking, United States v. Corning Glass Works; Section XVI, Note 1(m); HQ 954856

N Y C86285 Revoked; Signal Generator, Signal-Producing Device for Testing the Accuracy of Receiver Devices; Measuring or Checking Instrument; Instrument That Carries Out Steps in a Process for Inspecting Goods, Checking, United States v. Corning Glass Works; Section XVI, Note 1(m); HQ 954856

The tariff classification of a CRT Image Analyzer System, the digital camera unit and the power supply/pattern generator/computer interface unit

The tariff classification of an EMC testing equipment from the United Kingdom

The tariff classification of a microchip programmer, microchip socket adapters, an UV erasing tool, and a programmable EPROM simulator from Germany.

The tariff classification of Hystograph – Coercimeter from Germany

The tariff classification of Microwave Leakage Detector #27240 from China