Protest 1001-95-109483; KLA 1011 ACE Wafer Prober; KLA 1007 HF Wafer Prober

The tariff classification of a Bit Pattern Generator and an Error Analyzer from Germany.

The tariff classification of Integrated Circuit Handlers from JapanDear A. J. Spatarella: In your letter dated March 23, 1995, you requested a tariff classification ruling. The Integrated Circuit Handlers (IC) are high speed robotics models HM-3000 and MTH-1800. The model HM-3000 high speed test handler is developed for high pin count surface mount devices. The HM-3000 is designed to handle devices from 7 mm to 70 mm with device pitches as small as 0.3 mm. The model MTH-1800 high speed test handler is developed for high pin count surface mount devices presented in trays. The MTH-1800 pick and place handlers can be operated in two modes, Mode I is single test site operation and Mode II is dual test site operation. The applicable subheading for the IC Handlers will be 9030.89.4000, Harmonized Tariff Schedule of the United States (HTS), which provides for other instruments and apparatus designed to measure and check semiconductor wafers and devices (such as probe testers, resistivi

CMC 56 Test System for protection relays and measuring transducers; EN 85.24; EN 85.43; Chapter 85, note 6; Section XVI, note 4; Chapter 90, note 3; HQ 953551; HQ 089391; HQ 087498; U.S. v. Corning Glass Works

The tariff classification of panel meters from Taiwan.

The tariff classification of a phase sequence and motorrotation indicator from Canada.