🇺🇸
United States
9031410040
For wafers
Details
- Parent HS6
- 903141 Optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90
Related United States Codes
90314100
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
9031410020
For inspecting photomasks or reticles used in manufacturing semiconductor devices
9031410040
For wafers
9031410060
Other