🇨🇦
Canada
9031.41.00.00
Optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90, for inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
Canada Tariff Code 9031.41.00.00 falls under HS subheading 903141 (optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90). Goods classified here pay a general (MFN) duty rate of Free. Preferential rates, trade remedies and other duties can change what you actually pay.
Details
- Official Description
- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
- General Rate
- Free
- Unit of Quantity
- NMB
- Parent HS6
- 903141 Optical instruments and appliances; for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.c. in chapter 90
HS 903141 in Other Countries
CBP Rulings for HS 903141
817479
The tariff classification of inspection systems from Belgium
B89229
The tariff classification of the WT-85 Lifetime Scanner from Hungary
B89495
The tariff classification of a Deep Level Transient Spectrometer and a Lifetime Scanner from Hungary
D88817
The tariff classification of a Laser Electro Optics Edge (LEO) Profile Monitor Model LEP-820, Laser Electro Optics Edge Profile Monitor Model LEP-810, Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1000EP and Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1200EP from Japan
D89035
The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
View all 13 rulings for HS 903141 →