CBP Ruling Database
Search past U.S. Customs and Border Protection classification rulings. Find precedent for your product and cite it in your own classification.
12 rulings found
The tariff classification of semiconductor production and test equipmentfrom Japan.
The tariff classification of semiconductor production and test equipmentfrom Japan.
The tariff classification of Test Burn-in Test Systems from Japan
The tariff classification of Test Burn-in Test Systems from Japan
The tariff classification of Integrated Circuit Handlers from Japan
The tariff classification of Integrated Circuit Handlers from Japan
The tariff classification of Printed Circuit Board Testers from Ireland
The tariff classification of Printed Circuit Board Testers from Ireland
The tariff classification of Wafer Probers from Japan
The tariff classification of Wafer Probers from Japan
The tariff classification of X-Y In-Circuit Hi-Tester, 1240-02 from Japan
The tariff classification of X-Y In-Circuit Hi-Tester, 1240-02 from Japan
Revocation of Headquarters Ruling Letters (HQ) H011054 and HQ H011056; tariff classification of wafer probe cards
Revocation of Headquarters Ruling Letters (HQ) H011054 and HQ H011056; tariff classification of wafer probe cards
The tariff classification of dynamic test handlers from Japan
The tariff classification of dynamic test handlers from Japan
The tariff classification of a Core Development Platform (CDP) from Taiwan
The tariff classification of a Core Development Platform (CDP) from Taiwan
The tariff classification of an Integrated Development Platform from China.
The tariff classification of an Integrated Development Platform from China.
The tariff classification of semiconductor test equipment from Italy
The tariff classification of semiconductor test equipment from Italy
The tariff classification of integrated circuit sockets from Japan
The tariff classification of integrated circuit sockets from Japan