CBP Ruling Database
Search past U.S. Customs and Border Protection classification rulings. Find precedent for your product and cite it in your own classification.
11 rulings found
Application For Further Review Of Protest No. 3801-9-002721 (October 19, 1989); Scanning Laser Microscope; Optical Microscopes; Measuring, Checking Instruments And Appliances
Application For Further Review Of Protest No. 3801-9-002721 (October 19, 1989); Scanning Laser Microscope; Optical Microscopes; Measuring, Checking Instruments And Appliances
Protest No. 2809-0-000873; laser scanning microscope;Subheading 9012.10.00; Subheading 9013.80.60; HQ 088231.
Protest No. 2809-0-000873; laser scanning microscope;Subheading 9012.10.00; Subheading 9013.80.60; HQ 088231.
"Aladin Thermo Microscope"; Heading 9011; Heading 9012; EN 90.11; EN 90.12(A); HQ 088231
"Aladin Thermo Microscope"; Heading 9011; Heading 9012; EN 90.11; EN 90.12(A); HQ 088231
The tariff classification of Vacuum Scanning TunnelingMicroscopes, Software and Table from Japan
The tariff classification of Vacuum Scanning TunnelingMicroscopes, Software and Table from Japan
The tariff classification of scanning tunneling microscopes, atomic force microscopes, software and metal computer tables from Japan
The tariff classification of scanning tunneling microscopes, atomic force microscopes, software and metal computer tables from Japan
Protest 1001-98-102442; Measurement and Inspection SEM Microscope, Model MI-3080; Microscopes, Other than Optical Microscopes
Protest 1001-98-102442; Measurement and Inspection SEM Microscope, Model MI-3080; Microscopes, Other than Optical Microscopes
The tariff classification of the Nova 200 NanoLab
The tariff classification of the Nova 200 NanoLab
The tariff classification of JEM-1011 Transmission Electron Microscope (TEM) from Japan
The tariff classification of JEM-1011 Transmission Electron Microscope (TEM) from Japan
The tariff classification of scanning electron microscopes from Czech Republic
The tariff classification of scanning electron microscopes from Czech Republic
The tariff classification of Multiprobe LT S UHV System
The tariff classification of Multiprobe LT S UHV System
The tariff classification of a fluorescence confocal microscope from France
The tariff classification of a fluorescence confocal microscope from France