KLA Wafer Defect Review Station; Stereoscopic Optical Microscope; Robot Arm; Color RGB Camera; Color Monitor; Data Processing Machine; Software
Reasoning
KLA Wafer Defect Review Station; Stereoscopic Optical Microscope; Robot Arm; Color RGB Camera; Color Monitor; Data Processing Machine; Software
Cite this ruling
CBP Ruling 087455 (90314000): KLA Wafer Defect Review Station; Stereoscopic Optical Microscope; Robot Arm; Color RGB Camera; Color Monitor; Data Processing Machine; Software
Paste this into a product's override reason when citing this ruling as justification for a classification.
Other rulings for HS6 903140
Protest 1001-92-107315; Sira Image Automation laser-based inspection system; subheading 9031.80.00; HQ 080094, 080294, 084646, 952000, 953312, 953826; HSC, 7th Session (Doc. 36.457, 36.274 (HSC/6)); Timex Corp. v. U.S.; Digital Equipment Corp. v. U.S.; chapter 90, add. U.S. note 3; "optical instruments"
The tariff classification of Rail Profiling and Cross Section Profiling Systems from Canada
Protest 5501-93-100209; Ampoule Inspection Machine (AIM); Other Optical Measuring and Checking Instruments and Appliances; Aid or Enhance Human Vision; Functional Unit; Section XVI, Note 4; Additional U.S. Note 3 to Chapter 90; EN 9031.40
The tariff classification of Video Image Processors for Measuring Traffic Variables from Spain
Protest No. 3004-92-100136; Optimizer Systems With Scan Heads; Controller; Optical Measuring instruments; Headings 8537 and 9031; EN 85.37; HQ 085281