Protest 0401-1996-100112; Compound Optical Microscopes Used for Semiconductor Inspection; Measuring or Checking Instruments; Headings 9011 and 9031; EN 90.11; Carl Zeiss, Inc. v. United States, CIT Slip Op. 98-86; HQs 954662 and 956638
Reasoning
Protest 0401-1996-100112; Compound Optical Microscopes Used for Semiconductor Inspection; Measuring or Checking Instruments; Headings 9011 and 9031; EN 90.11; Carl Zeiss, Inc. v. United States, CIT Slip Op. 98-86; HQs 954662 and 956638
Cite this ruling
CBP Ruling 959109 (90112080): Protest 0401-1996-100112; Compound Optical Microscopes Used for Semiconductor Inspection; Measuring or Checking Instruments; Headings 9011 and 9031; EN 90.11; Carl Zeiss, Inc. v. United States, CIT Slip Op. 98-86; HQs 954662 and 956638
Paste this into a product's override reason when citing this ruling as justification for a classification.
Other rulings for HS6 901120
Reconsideration NY 838760; Stereo microscopes; compoundoptical microscopes; HQ 085754; Subheading 9011.20.40;Subheading 9011.20.80.
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Protest 3001-01-100486; Compound optical microscope; and Maxscope viewer